Applications are invited as soon as possible for a PhD position available in the area of Physical Electronics in Electrical Engineering at Old Dominion University.
US National Science Foundation
This National Science Foundation (NSF) sponsored research seeks to develop a secondary ion mass spectrometer (SIMS) with higher sensitivity than current commercial SIMS and also with better depth resolution. The key technological improvement is the use of multicharged ion pulses generated from a compact laser ion source as the primary beam. Current commercial SIMS instruments use singly-charged ions or clusters for the primary beam, which causes secondary ion ejection by collisional sputtering from the surface of a sample. Multicharged primary ions with high potential energy will cause potential sputtering in addition to collisional sputtering, in which the ionization probability can be two-to-three orders of magnitude higher. The ionization probability determines the ultimate sensitivity limit of SIMS and the minimum amount of sputtered sample material needed to achieve a detectable signal. This is an interdisciplinary research and development involving faculty in electrical engineering and physics working in collaboration with a senior researcher at the Lawrence Berkeley National Laboratory. The instrumentation development will involve working with a charged particle trajectory code, using laser-plasma as an ion source, developing ion beam components, and studying ion-surface interactions. Project applications besides SIMS include ion deposition and implantation. Candidates with M.S. in electrical engineering, physics, or materials science are preferred.
Applicants will receive tuition and stipend as a graduate research assistant. All outstanding candidates will be considered. To apply, please send a CV including a summary of research interests to Prof. Hani Elsayed-Ali, firstname.lastname@example.org. The expected start date is May 2024.
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